

Working at the interface of semiconductor physics and synchrotron radiation science, Naoki Hayase investigates how devices and materials behave under X-ray-based analysis, with particular attention to nanoscale processing and design. His research explores connections between fundamental scattering phenomena and the development of next-generation technologies, linking specialized engineering knowledge with the broader teaching mission of the School of Engineering and Graduate School of Engineering.
In this research area, students investigate devices and semiconductor materials using synchrotron radiation, exploring how processing and design decisions influence nanoscale structure through X-ray and scattering techniques. The work builds skills in experimental and analytical methods, data interpretation, and clear technical communication.
This research theme examines devices and semiconductor materials through the lens of synchrotron radiation, applying X-ray and scattering techniques to probe how processing and design choices shape nanoscale material properties. By connecting fundamental physical principles to engineering practice, the work builds the ability to define problems, evaluate evidence, and propose practical solutions.